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商品編號


A-PROBE-10



品牌


NanoAndMore



公司


nanoandmore



公司分類(lèi)


Self Sensing and Self Actuating AFM Probes



Coating:

None


Tip shape:

Visible


Size

Box of 10 AFM Probes

商品信息

Cantilever:
F: 50 kHz
C: 5 N/m
L: 310 ?m
Applications:
Self-Sensing & Self-Actuating AFM Probes
Description:

Novel self-sensing and self-actuating (-exciting) probe for dynamic mode Atomic Force Microscopy (AFM)
Akiyama-Probe is based on a quartz tuning fork combined with a micromachined cantilever. The great advantage of this novel probe is that one can benefit from both the tuning fork's extremely stable oscillation and the silicon cantilever's reasonable spring constant with one probe.
Akiyama-Probe is equipped with a special version of the NANOSENSORS? AdvancedTEC, a high-end sharp silicon tip and has an excellent imaging cap
ABI
lity on various samples with different properties, which is as high as that of a conventional optical lever system.
Akiyama-Probe requires neither optical detection, nor an external shaker. Akiyama-Probe occupies only a small volume above the sample. These features make it very attractive for creating a new generation of scanning probe microscopy (SPM) instruments.
Uncoated


AFM Tip:


shape:

Vis
IBL
e



height:

28 ?m



r
ADI
us:

< 15="">


AFM Cantilever:


shape:
Double beam


length:
310 ?m


width:
30 ?m


thickness:
3.7 ?m


force constant:
5 N/m


resonance frequency:
50 kHz