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商品編號


KNT-SThM-1an-5



品牌


NanoAndMore



公司


nanoandmore



公司分類(lèi)


Scanning Thermal Microscopy AFM Probes



Coating:

None


Tip shape:

Custom


Size

Box of 5 AFM Probes

商品信息

Cantilever:
F:
C: 0.25 N/m
L: 150 ?m
Applications:
Scanning Thermal Microscopy AFM Probes
Description:
Scanning thermal microscopy probe with integrated Pall
ADI
um resistance
Thermo
meter for thermal mapping in contact mode. The tip can be heated to map thermal conductivity on passive samples, or biased to measure local hotspots.
The probes offer the following features:


Vis
IBL
e tip cantilever

Resistance
Thermo
meter located at the tip apex.

Resistance 250 to 400 Ω (typ 320 Ω)

Sensitivity 1 Ω / ?C (approx)

Silicon nitride cantilever (400nm thick)

Tall tip height (~10um) for high aspect ratio features

Fine tip (<100nm r
ADI
us) for high resolution thermal measurements.

Measure tip resistance with simple Wheatstone bridge or apply apply an A.C. signal and use lock in detector.

Probe base:?2mm x 3mm


Electrical connection is made to two Au pads on the probes base by either wire bonding, conducting epoxy/paste or mechanical clips.
Other applications include applying single point voltages, providing local current stimulus, or detecting thermal properties resulting in cantilever deflections (not generally suitable for scanning un-insulated electrically active samples without electronics to float the probe potential).
Resistive Tip Coating of 5nm NiCr and 40nm Pall
ADI
um. Tip side track and pad coating of 5nm NiCr + 140nm and series resistor coatings of NiCr (33nm).



AFM Tip:


shape:

Custom



height:

10 ?m



r
ADI
us:

< 100="">


AFM Cantilever:


length:
150 ?m


width:
60 ?m


thickness:
0.4 ?m


force constant:
0.25 N/m