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商品編號


Q-WM300-10



品牌


NanoAndMore



公司


nanoandmore



公司分類(lèi)


Premounted AFM Probes



Coating:

Reflex Aluminum


Tip shape:

Rotated


Size

Box of 10 AFM Probes

商品信息

Cantilever:
F: 300 kHz
C: 40 N/m
L: 125 ?m
Applications:
Premounted AFM Probes
Description:

Monolithic silicon AFM probe for high frequency non-contact and tapping mode operation.

The rotated tip allows for more symmetric representation of high sample features. The consistent tip r
ADI
us ensures good resolution and reproducibility.

Consistent high quality at a lower price!

Premounted AFM probe on a Quesant T-plate for Quesant AFM systems. Based on a BudgetSensors Tap300Al-G AFM probe.

Aluminium reflex coating on detector side of the cantilever, 30 nm thick



AFM Tip:


shape:

Rotated



height:

17 ?m
(15 - 19 ?m)*



setback:

15 ?m
(10 - 20 ?m)*



r
ADI
us:

< 10="">



half cone angle:

20°-25° front view, 25°-30° from side, 10° at the apex


AFM Cantilever:


shape:
Beam


length:
125 ?m
(115 - 135 ?m)*



width:
30 ?m
(25 - 35 ?m)*



thickness:
4 ?m
(3 - 5 ?m)*



force constant:
40 N/m
(20 - 75 N/m)*



resonance frequency:
300 kHz
(200 - 400 kHz)*




* typical range