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商品編號


Q-EFM-10



品牌


NanoAndMore



公司


nanoandmore



公司分類(lèi)


Premounted AFM Probes



Coating:

Electrically Conductive


Tip shape:

Rotated


Size

Box of 10 AFM Probes

商品信息

Cantilever:
F: 75 kHz
C: 3 N/m
L: 225 ?m
Applications:
Premounted AFM Probes
Description:

Monolithic silicon AFM probe for force modulation and pulsed force mode (PFM), and electric modes such as:


scanning capacitance microscopy (SCM)

electrostatic force microscopy (EFM)

Kelvin probe force microscopy (KFM)


The rotated tip allows for more symmetric representation of high sample features. The consistent tip r
ADI
us ensures good resolution and reproducibility.

Consistent high quality at a lower price!

Premounted AFM probe on a Quesant T-plate for Quesant AFM systems. Based on a BudgetSensors ElectriMulti75-G AFM probe.

Electrically conductive coating of 5 nm Chromium and 25 nm Platinum on both sides of the cantilever. This coating also enhances the laser reflectivity of the cantilever.



AFM Tip:


shape:

Rotated



height:

17 ?m
(15 - 19 ?m)*



setback:

15 ?m
(10 - 20 ?m)*



r
ADI
us:

< 10="">



half cone angle:

20°-25° front view, 25°-30° from side, 10° at the apex


AFM Cantilever:


shape:
Beam


length:
225 ?m
(215 - 235 ?m)*



width:
28 ?m
(23 - 33 ?m)*



thickness:
3 ?m
(2 - 4 ?m)*



force constant:
3 N/m
(1 - 7 N/m)*



resonance frequency:
75 kHz
(60 - 90 kHz)*




* typical range