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商品編號


Q-Cond-E-10



品牌


NanoAndMore



公司


nanoandmore



公司分類(lèi)


Premounted AFM Probes



Coating:

Electrically Conductive


Tip shape:

Rotated


Size

Box of 10 AFM Probes

商品信息

Cantilever:
F: 13 kHz
C: 0.2 N/m
L: 450 ?m
Applications:
Premounted AFM Probes
Description:

Monolithic silicon AFM probe for contact mode and lateral force mode operation and electric modes such as:


scanning capacitance microscopy (SCM)

scanning probe lithography


The rotated tip allows for more symmetric representation of high sample features. The consistent tip r
ADI
us ensures good resolution and reproducibility.

Consistent high quality at a lower price!

Premounted AFM probe on a Quesant T-plate for Quesant AFM systems. Based on a BudgetSensors ElectriCont-G AFM probe.

Electrically conductive coating of 5 nm Chromium and 25 nm Platinum on both sides of the cantilever. This coating also enhances the laser reflectivity of the cantilever.



AFM Tip:


shape:

Rotated



height:

17 ?m
(15 - 19 ?m)*



setback:

15 ?m
(10 - 20 ?m)*



r
ADI
us:

< 25="">



half cone angle:

20°-25° front view, 25°-30° from side, 10° at the apex


AFM Cantilever:


shape:
Beam


length:
450 ?m
(440 - 460 ?m)*



width:
50 ?m
(45 - 55 ?m)*



thickness:
2 ?m
(1 - 3 ?m)*



force constant:
0.2 N/m
(0.07 - 0.4 N/m)*



resonance frequency:
13 kHz
(9 - 17 kHz)*




* typical range